We are able to supply waferprobing solutions for a wide spectrum of applications ranging from very simple probers for single dies or other small samples, manual probers for wafersizes from 6 to 12” to semiautomatic or even fully automated systems. Upon request each prober can be equipped with a thermal chuck, a laser cutter for failure analysis or a low signal EMV shield. Specially adapted systems for on-wafer measurements of very low currents or characterization of microwave circuits are available. We are also able to provide help if you plan to upgrade or expand your existing waferprobing system.